增加批量增加用例、测试项、设计需求功能

This commit is contained in:
2025-12-19 18:08:19 +08:00
parent f3806687b0
commit 3e048ea876
235 changed files with 1984 additions and 201 deletions

View File

@@ -31,6 +31,7 @@ class AITestController(ControllerBase):
"children": [
{
"name": "外部32MHz时钟布线到HCLKBUF级冲测试",
"subDescription": "验证外部32MH布线的测试子项描述",
"subStep": [
{
"operation": "配置FPGA逻辑将外部32MHz晶振输入连接到HCLKBUF缓冲器。",
@@ -45,6 +46,7 @@ class AITestController(ControllerBase):
]
}, {
"name": "内部10KHz时钟布线到CLKINT缓冲测试",
"subDescription": "验证内部10KHz时钟布线到CLKINT缓冲的测试子项描述",
"subStep": [
{
"operation": "在FPGA中启用内部10KHz时钟源并将其连接至CLKINT缓冲器。",
@@ -59,6 +61,7 @@ class AITestController(ControllerBase):
]
}, {
"name": "异常情况下的时钟处理测试",
"subDescription": "验证异常情况下的时钟处理测试的测试子项描述",
"subStep": [
{
"operation": "断开外部32MHz晶振输入后尝试进行HCLKBUF配置。",
@@ -76,7 +79,7 @@ class AITestController(ControllerBase):
}
]
return {
"history":[["我是没有用的",json.dumps(res)]]
"history": [["我是没有用的", json.dumps(res)]]
}
# 这是其他common内容接口